Advanced Methods in Materials Characterization

Teaching Methods

Continuous assessment during laboratory classes gives access to the written examination. Minimum approval of 9.5/20 in the exam.

Learning Outcomes

Different techniques of materials and surface characterization will be issued. Principles and case studies will be addressed for each technique, preferably within the student’s work. This practical approach ensures the resolution of real problems and is useful for their doctoral plan.

Work Placement(s)

No

Syllabus

1. Crystallography and diffraction theory.

2. X-ray diffraction.

3. Electron microscopy.

4. Atomic force microscopy.

5. X-ray spectroscopies.

6. Optical spectroscopies.

7. Surface spectroscopies.

8. Nuclear Magnetic Ressonance.

9. Thermal analysis: differential thermal analysis, differential scanning calorimetry and dilatometry.

Assessment Methods

Evaluation
Exam: 100.0%

Bibliography

Title:The Basics of Crystallography and Diffraction

Author(s):C. Hammond

Year:2001

Reference:IUCr, Oxford Science Publications

Title:Electron Microscopy and Analysis

Author(s):P. J. Goodhew and F. J. Humphreys

Year:1988

Reference:Taylor & Francis, London

Title:Basic Principles of Spectroscopy

Author(s):Raymond Chang

Year:1971

Reference: International Student Edition, McGraw-Hill Kogakusha, Ltd.

Title:Practical Surface Analysis. Auger and X-Ray Photoelectron Spectroscopy

Author(s):M. Briggs and P.Seah

Year:1990

Reference:John Wiley & Sons, New York

Title:Ressonância Magnética Nuclear. Fundamentos, Métodos e Aplicações

Author(s):V.M.S. Gil e C.F.G.C. Geraldes

Year:1987

Reference:Fundação Calouste Gulbenkian, Lisbon