Laboratories Transmission Electron Microscopy

Recommended Prerequisites

Not applicable.

Teaching Methods

The practical components of the TEM laboratories course will be given predominantly in tutorial regime and in

work sessions with the instruments, in small groups of 2-3 students.

The lectures dedicated to HRTEM image and electron diffraction pattern simulations will be presented in expository sessions, involving media, and extended as tutored group work during the week.

Students are required to reinforce the subjects presented in the lectures and acquire a deeper understanding of TEM image formation process, diffraction and electron spectroscopy, making and analysis of the results.

Learning Outcomes

- Acquisition of necessary skills to perform, autonomously, research work using transmission electron microscopy (TEM);

- Enhance the capability of independent selection and application of advanced experimental techniques to solve complex problems of science and technology.

Upon completion of this course the student should be able to:

- Select and use correctly the techniques more appropriate to prepare samples for TEM;

- Know the operation principles and operate the TEM instrument and associated instruments;

- Interpret the TEM images, diffraction patterns and electron spectroscopy data;

- Perform calculations and simulations of HRTEM images, diffraction patterns and electron spectroscopy data.

Work Placement(s)

No

Syllabus

- Preparation of ceramic, metallic, polymeric and biological samples for TEM;

- Structure and work principles of the transmission electron microscope;

- Startup operations, adjustment the electron beam emission, beam alignment, focus and astigmatism correction, adjustment of contrast and image recording. Safety, standby and turn off procedures;

- TEM image and electron diffraction. Image and diffraction mode selection. Selected area diffraction, and nanodiffraction.

Crystallographic re-orientation of crystals. Indexation of electron diffraction patterns (monocrystals and polycrystals) and calculation of the crystallographic beam orientation. Diffraction contrast. Bright and dark field images. High resolution images (HRTEM);

- Electron spectroscopy. Elemental analysis by EDS and EELS. Quantitative and qualitative analysis;

- Processing and simulation of TEM images and electron diffraction patterns.

Assessment Methods

Assessment
Individual written report and oral presentation of a case study : 100.0%

Bibliography

D.B. Williams e C.B. Carter, Transmission electron microscopy - textbook for materials science, 3ª edição, Springer, 2009.

J.C.H. Spence, High resolution electron microscopy, 3ª edição, Oxford University Press, 2003.

P. B. Hirch, Electron microscopy of thin crystals, 2ª edição, Robert E. Krieger Publishing, 1977.

P. J. Goodhew, Specimen preparation in materials science - practical methods in electron microscopy, North Holland, 1973.

M. Graef e M.E. McHenry, Structure of materials – an introduction to crystallography, diffraction and symmetry, Cambridge University Press, 2007.